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<oai_dc:dc schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
<dc:title>Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices</dc:title>
<dc:creator>Fernández, Francisco V.</dc:creator>
<dc:creator>Roca, Elisenda</dc:creator>
<dc:creator>Saraza-Canflanca, P.</dc:creator>
<dc:creator>Martin-Martinez, J.</dc:creator>
<dc:creator>Rodriguez, R.</dc:creator>
<dc:creator>Nafria, M.</dc:creator>
<dc:creator>Castro-López, R.</dc:creator>
<dc:contributor>Junta de Andalucía</dc:contributor>
<dc:contributor>Agencia Estatal de Investigación (España)</dc:contributor>
<dc:contributor>Ministerio de Ciencia e Innovación (España)</dc:contributor>
<dc:subject>characterization | modeling | parameter extraction | time-dependent variability</dc:subject>
<dc:description>Trabajo presentado en el International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), celebrado en Funchal (Portugal) del 3 al 5 de Julio de 2023. Copyright IEEE</dc:description>
<dc:description>Time-dependent variability phenomena are stochastic and discrete for nanometer-scale technologies, and, hence, must be statistically characterized. These phenomena are attributed to the emission and capture of charges in device defects. This paper explores two different strategies to extract, from experimental data, the distribution parameters of the time constants of the defects. It delves into the accuracy of each strategy, showing how the extraction strategy can have a huge impact on the accuracy and the amount of characterization data required, and, therefore, on the amount of (expensive) characterization time in the lab.</dc:description>
<dc:description>This work was supported by grant ProyExcel_00536 funded by Consejería de Universidad, Investigación e Innovación of Junta de Andalucía. It was also supported by grants PID2019-103869RB-C31/C32 funded by MCIN/AEI/10.13039/501100011033 and by grant TED2021-131240B-I00 funded by MCIN/AEI/10.13039/501100011033 and by the “European Union NextGenerationEU/PRTR”.</dc:description>
<dc:description>Peer reviewed</dc:description>
<dc:date>2024-04-24T16:50:38Z</dc:date>
<dc:date>2024-04-24T16:50:38Z</dc:date>
<dc:date>2023-07-31</dc:date>
<dc:type>Conference Paper</dc:type>
<dc:identifier>9798350332650</dc:identifier>
<dc:identifier>http://hdl.handle.net/10261/354896</dc:identifier>
<dc:identifier>10.1109/SMACD58065.2023.10192206</dc:identifier>
<dc:identifier>2-s2.0-85168691886</dc:identifier>
<dc:identifier>https://api.elsevier.com/content/abstract/scopus_id/85168691886</dc:identifier>
<dc:language>en</dc:language>
<dc:relation>#PLACEHOLDER_PARENT_METADATA_VALUE#</dc:relation>
<dc:relation>#PLACEHOLDER_PARENT_METADATA_VALUE#</dc:relation>
<dc:relation>#PLACEHOLDER_PARENT_METADATA_VALUE#</dc:relation>
<dc:relation>#PLACEHOLDER_PARENT_METADATA_VALUE#</dc:relation>
<dc:relation>info:eu-repo/grantAgreement/Junta de Andalucia/ PLAN ANDALUZ DE INVESTIGACIÓN, DESARROLLO E INNOVACIÓN (PAIDI 2020)/ ProyExcel_00536/EXPLOTACIÓN DEL RTN PARA SEGURIDAD HARDWARE RESISTENTE AL ENVEJECIMIENTO (RTN-SECURE)</dc:relation>
<dc:relation>info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/PID2019-103869RB-C31/ES/THE VARIABILITY CHALLENGE IN NANO-CMOS: FROM DEVICE MODELING TO IC DESIGN FOR MITIGATION AND EXPLOITATION (VIGILANT-IMSE)/</dc:relation>
<dc:relation>info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/PID2019-103869RB-C32/ES/EL RETO DE LA VARIABILIDAD EN NANO-CMOS Y BEYOND-CMOS: EVALUACION DE MATERIALES Y DISPOSITIVOS PARA SU MITIGACION Y EXPLOTACION (VIGILANT-UAB)/</dc:relation>
<dc:relation>info:eu-repo/grantAgreement/AEI/PLAN ESTATAL DE INVESTIGACIÓN CIENTÍFICA, TÉCNICA Y DE INNOVACIÓN 2021-2023/TED2021-131240B-I00/ES VARIABILIDAD TEMPORAL EN CIRCUITOS INTEGRADOS: ENEMIGO (Y COMO COMBATIRLO PARA LA ECONOMIA CIRCULAR) Y AMIGO (Y COMO EXPLOTARLO PARA UNA SOLUCION DISRUPTIVA EN CIBERSEGURIDAD)</dc:relation>
<dc:relation>Proceedings - 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2023</dc:relation>
<dc:relation>Postprint</dc:relation>
<dc:relation>https://doi.org/10.1109/SMACD58065.2023.10192206</dc:relation>
<dc:relation>Sí</dc:relation>
<dc:rights>open</dc:rights>
<dc:publisher>Institute of Electrical and Electronics Engineers</dc:publisher>
</oai_dc:dc>