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<oai_dc:dc schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
<dc:title>Reliability evaluation of IC Ring Oscillator PUFs</dc:title>
<dc:creator>Gata-Romero, J. M.</dc:creator>
<dc:creator>Roca, Elisenda</dc:creator>
<dc:creator>Núñez, Juan</dc:creator>
<dc:creator>Castro-López, R.</dc:creator>
<dc:creator>Fernández, Francisco V.</dc:creator>
<dc:contributor>Agencia Estatal de Investigación (España)</dc:contributor>
<dc:contributor>Ministerio de Ciencia e Innovación (España)</dc:contributor>
<dc:contributor>Junta de Andalucía</dc:contributor>
<dc:contributor>Fernández, Francisco V. [0000-0001-8682-2280]</dc:contributor>
<dc:contributor>Gata-Romero, J. M. [0009-0005-5782-1998]</dc:contributor>
<dc:subject>Aging | Frequency degradation | Physical Unclonable Function | Ring oscillators</dc:subject>
<dc:description>Trabajo presentado en el International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), celebrado en Funchal (Portugal) del 3 al 5 de Julio de 2023. Copyright IEEE</dc:description>
<dc:description>Silicon-based Physical Unclonable Functions (PUFs) have become a popular solution to provide security in many applications. PUFs are circuits that take advantage of the innate variability of the fabrication processes to deliver a different output for each implementation of the same circuit. This unique response needs to be reliable to environmental conditions, like temperature variations or power supply variations, but also needs to stay stable over time, i.e., the circuit output should be resilient to aging. In this paper, a reliability study of a PUF based on Ring Oscillators (RO) in a 65-nm CMOS technology is presented. Experimental results are performed on different die samples, including temperature and power supply variations. Aging degradation is characterized using accelerated aging tests, taking advantage of the unique properties of two arrays of ROs included in a chip specifically designed to accurately characterize aging degradation.</dc:description>
<dc:description>This work was supported by grant PID2019-103869RBC31 funded by MCIN/AEI/10.13039/501100011033. The work was also supported by grant TED2021-131240B-I00 funded by MCIN/AEI/10.13039/501100011033 and by the “European Union NextGenerationEU/PRTR, by grant ProyExcel_00536 funded by Consejería de Universidad, Investigación e Innovación, Junta de Andalucía, and by grant US-1380876 funded by Consejería de Economía, Conocimiento, Empresas y Universidad de la Junta de Andalucía and by P.O. FEDER.</dc:description>
<dc:description>Peer reviewed</dc:description>
<dc:date>2024-04-24T16:07:28Z</dc:date>
<dc:date>2024-04-24T16:07:28Z</dc:date>
<dc:date>2023-07-31</dc:date>
<dc:type>Conference Paper</dc:type>
<dc:identifier>9798350332650</dc:identifier>
<dc:identifier>http://hdl.handle.net/10261/354893</dc:identifier>
<dc:identifier>10.1109/SMACD58065.2023.10192243</dc:identifier>
<dc:identifier>2-s2.0-85168675433</dc:identifier>
<dc:identifier>https://api.elsevier.com/content/abstract/scopus_id/85168675433</dc:identifier>
<dc:language>en</dc:language>
<dc:relation>#PLACEHOLDER_PARENT_METADATA_VALUE#</dc:relation>
<dc:relation>#PLACEHOLDER_PARENT_METADATA_VALUE#</dc:relation>
<dc:relation>#PLACEHOLDER_PARENT_METADATA_VALUE#</dc:relation>
<dc:relation>info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/PID2019-103869RB-C31/ES/THE VARIABILITY CHALLENGE IN NANO-CMOS: FROM DEVICE MODELING TO IC DESIGN FOR MITIGATION AND EXPLOITATION (VIGILANT-IMSE)/</dc:relation>
<dc:relation>info:eu-repo/grantAgreement/AEI/ PLAN ESTATAL DE INVESTIGACIÓN CIENTÍFICA, TÉCNICA Y DE INNOVACIÓN 2021-2023/TED2021-131240B-I00/ES VARIABILIDAD TEMPORAL EN CIRCUITOS INTEGRADOS: ENEMIGO (Y COMO COMBATIRLO PARA LA ECONOMIA CIRCULAR) Y AMIGO (Y COMO EXPLOTARLO PARA UNA SOLUCION DISRUPTIVA EN CIBERSEGURIDAD)</dc:relation>
<dc:relation>info:eu-repo/grantAgreement/Junta de Andalucia/ PLAN ANDALUZ DE INVESTIGACIÓN, DESARROLLO E INNOVACIÓN (PAIDI 2020)/ ProyExcel_00536/EXPLOTACIÓN DEL RTN PARA SEGURIDAD HARDWARE RESISTENTE AL ENVEJECIMIENTO (RTN-SECURE)</dc:relation>
<dc:relation>Proceedings - 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2023</dc:relation>
<dc:relation>Postprint</dc:relation>
<dc:relation>https://doi.org/10.1109/SMACD58065.2023.10192243</dc:relation>
<dc:relation>Sí</dc:relation>
<dc:rights>open</dc:rights>
<dc:publisher>Institute of Electrical and Electronics Engineers</dc:publisher>
</oai_dc:dc>